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US 12,723,510 B1Granted
Real-time monitoring of an electronic assembly using an optical waveguide
AssigneeSchlumberger Technology Corporation
InventorsMahmoud Ali, Hocine Daou, Cleverson Souza Chaves
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Abstract
The present disclosure provides techniques and apparatus for real-time monitoring of an electronic assembly using an optical waveguide. An example electronic assembly includes at least one component, at least one optical waveguide and a controller. The controller is configured to determine one or more operating parameters of the at least one component via the optical waveguide. The controller may trigger one or more corrective actions based on the operating parameters.
Claims16
An electronic assembly comprising:
- at least one component;
- at least one optical waveguide;
- a substrate;
- and
- a controller configured to;
- detect an intensity of an optical signal within the at least one optical waveguide at a first position within the electronic assembly, wherein the at least one component is located at the first position, wherein the first position comprises a position on a surface of the substrate, and wherein the at least one optical waveguide is routed in a groove disposed on the surface of the substrate or is inserted in a middle layer of a stack of layers of the substrate;
- determine a first one or more representative operating parameters at the first position based at least in part on the intensity of the optical signal at the first position;
- and
- determine, via the at least one optical waveguide, one or more operating parameters of the at least one component by using the first one or more representative operating parameters as the one or more operating parameters of the at least one component.
6 more elements
A system comprising:
- at least one electronic assembly comprising at least one component and at least one optical waveguide;
- and
- a controller configured to;
- detect an intensity of an optical signal within the at least one optical waveguide at a first position within the at least one electronic assembly, wherein the at least one component is located at a second position within the at least one electronic assembly;
- determine a first one or more representative operating parameters at the first position based at least in part on the intensity of the optical signal at the first position;
- and
- determine, via the at least one optical waveguide, one or more operating parameters of the at least one component by:
- determining a second one or more representative operating parameters at the second position based at least in part on the first one or more representative operating parameters;
- and
- using the second one or more representative operating parameters as the one or more operating parameters of the at least one component.
7 more elements
A method comprising:
- monitoring operation of at least one electronic assembly comprising at least one component, a substrate, and at least one optical waveguide;
- detecting an intensity of an optical signal within the at least one optical waveguide at a first position within the electronic assembly, wherein the at least one component is located at the first position, wherein the first position comprises a position on a surface of the substrate, and wherein the at least one optical waveguide is routed in a groove disposed on the surface of the substrate or is inserted in a middle layer of a stack of layers of the substrate;
- determining a first one or more representative operating parameters at the first position based at least in part on the intensity of the optical signal at the first position;
- and
- determining, via the at least one optical waveguide, one or more operating parameters of the at least one component by using the first one or more representative operating parameters as the one or more operating parameters of the at least one component.
2 more elements
Dependencies are inferred from the claim text.