Bump-on-trace design for enlarge bump-to-trace distance
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsSheng-Yu Wu, Tin-Hao Kuo, Chen-Shien Chen
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsSheng-Yu Wu, Tin-Hao Kuo, Chen-Shien Chen
Estimating the term…
A package includes a first and a second package component. The first package component includes a first metal trace and a second metal trace at the surface of the first package component. The second metal trace is parallel to the first metal trace. The second metal trace includes a narrow metal trace portion having a first width, and a wide metal trace portion having a second width greater than the first width connected to the narrow metal trace portion. The second package component is over the first package component. The second package component includes a metal bump overlapping a portion of the first metal trace, and a conductive connection bonding the metal bump to the first metal trace. The conductive connection contacts a top surface and sidewalls of the first metal trace. The metal bump is neighboring the narrow metal trace portion.
A package comprising:
A package comprising:
A package comprising:
Dependencies are inferred from the claim text.