Manufacturing method for semiconductor device
AssigneeTokyo Electron Limited
InventorsKiyotaka Imai, Motoyuki Sato, Yoshihiro Hirota, Takuya Higuchi
Life of this patent
Estimating the term…
Loading patent…
AssigneeTokyo Electron Limited
InventorsKiyotaka Imai, Motoyuki Sato, Yoshihiro Hirota, Takuya Higuchi
Estimating the term…
A manufacturing method for a semiconductor device including a first semiconductor element and a second semiconductor element, includes the steps of forming an insulating layer on a first substrate having a first elastic modulus higher than a second elastic modulus, forming a first semiconductor element having a first bonding surface on the insulating layer, forming a second semiconductor element having a second bonding surface on a second substrate having the second elastic modulus, bonding the first bonding surface and the second bonding surface to each other to form a laminate of the first semiconductor element and the second semiconductor element, and removing the first substrate from the laminate.
A manufacturing method for a semiconductor device including a first semiconductor element and a second semiconductor element, comprising the steps of:
Dependencies are inferred from the claim text.