Source or drain metallization prior to contact formation in stacked transistors
AssigneeIntel Corporation
InventorsGilbert Dewey, Cheng-Ying Huang, Nicole K. Thomas, Marko Radosavljevic, Patrick Morrow, Ashish Agrawal, Willy Rachmady, Nazila Haratipour, Seung Hoon Sung, I-Cheng Tung, Christopher M. Neumann, Koustav Ganguly, Subrina Rafique
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