Nitride-based semiconductor device and method for manufacturing the same
AssigneeInnoscience (Suzhou) Technology Co., Ltd.
InventorsChao Yang, Chunhua Zhou, Qiyue Zhao, Jingyu Shen
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AssigneeInnoscience (Suzhou) Technology Co., Ltd.
InventorsChao Yang, Chunhua Zhou, Qiyue Zhao, Jingyu Shen
Estimating the term…
A nitride-based semiconductor device includes a first nitride-based semiconductor layer, a nitride-based multiple semiconductor layer, a gate electrode, a gate insulator layer, and a source electrode. The first nitride-based semiconductor layer includes a drift region and at least two doped barrier regions defining an aperture in the drift region. The nitride-based multiple semiconductor layer structure is disposed over the first nitride-based semiconductor layer and has a first heterojunction and a second heterojunction which are separated from each other. The gate electrode is received by the nitride-based multiple semiconductor layer structure and vertically aligns with the aperture in the drift region. The gate insulator layer is disposed between the nitride-based multiple semiconductor layer structure and the gate electrode. The source electrode is disposed over the first nitride-based semiconductor layer and abuts against the first and second heterojunctions of the nitride-based multiple semiconductor layer structure.
A nitride-based semiconductor device, comprising:
A method for manufacturing a semiconductor device, comprising:
Dependencies are inferred from the claim text.