Mass spectrometry with time-offset electrospray ion beams
AssigneeTrace Matters Scientific LLC
InventorMazdak Taghioskoui
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AssigneeTrace Matters Scientific LLC
InventorMazdak Taghioskoui
Estimating the term…
A mass spectrometry system includes an electrospray ion source, one or more ion inlets, and one or more mass analyzers. The electrospray ion source includes at least a first electrospray emitter and a second electrospray emitter. The first electrospray emitter produces a first ion beam, and the second electrospray emitter produces a second ion beam. The mass spectrometry system measures the first ion beam produced by the first emitter and the second ion beam produced by the second emitter. A first point in time (T1) corresponds to a first chromatographic peak that the mass spectrometry system measures from the first ion beam. A second point in time (T2) corresponds to a second chromatographic peak that the mass spectrometry system measures from the second ion beam. The first point in time (T1) and the second point in time (T2) are separated by a predetermined time delay or offset (deltaT).
A mass spectrometry system comprising:
A mass spectrometry system comprising:
A method for mass spectrometry analysis comprising:
A mass spectrometry system comprising:
Dependencies are inferred from the claim text.