Method to qualify additional dies after master die
AssigneePratt & Whitney Canada Corp.
InventorMichael Morash
Life of this patent
Estimating the term…
Abstract
A method of qualifying an addition die includes the steps of obtaining a master die that has been certified, and performing a master 3D scan on the master die. A second 3D scan is performed on an additional die made according to original specifications of the master die. The second 3D scan is compared to the master 3D scan of the master die. Then, the additional die is certified for production should the second 3D scan of the additional die be acceptably close to the master 3D scan of the master die.
Claims14
A method of qualifying an addition die comprising the steps of:
- obtaining a master die that has been certified, and performing a master 3D scan on the master die;
- performing a second 3D scan on an additional die made according to specifications of the master die;
- comparing the master 3D scan of the master die to the second 3D scan of the additional die;
- certifying the additional die for production should the second 3D scan of the additional die be acceptably close to the master 3D scan of the master die;
- and
- wherein the master die is qualified by building an initial master die, and producing a qualification lot of components from the initial master die, then performing inspection on the qualification lot components and accepting or rejecting the initial master die based upon that inspection.
A method of qualifying an addition die comprising the steps of:
- obtaining a master die that has been certified, and performing a master 3D scan on the master die;
- performing a second 3D scan on an additional die made according to specifications of the master die;
- comparing the master 3D scan of the master die to the second 3D scan of the additional die;
- certifying the additional die for production should the second 3D scan of the additional die be acceptably close to the master 3D scan of the master die;
- and
- wherein if the second 3D scan of the additional die is not acceptably close to the master 3D scan of the master die then the additional die is reworked and a third scan is taken and compared to the master scan.
Dependencies are inferred from the claim text.