Computer system, dimension measuring method, and semiconductor device manufacturing system
AssigneeHitachi High-Tech Corporation
InventorsYutaka Okuyama, Takeshi Ohmori
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AssigneeHitachi High-Tech Corporation
InventorsYutaka Okuyama, Takeshi Ohmori
Estimating the term…
A computer system for extracting, from image data, coordinate information on base points for measuring a dimension of a desired portion of a pattern, and measuring the dimension by using the coordinate information, the computer system including a preprocessing unit configured to allow training by matching all of the samples by setting a base point insufficient in annotation data as an insufficient measurement portion and shielding the insufficient measurement portion on the image data for the sample in which coordinate values of only a part of the base points are described, the preprocessing unit is also configured to allow learning and is trained in advance by using training data in which the image data is set as an input and the coordinate information is set as an output, and the preprocessing unit extracts the coordinate information and the dimension for new image data input for learning.
A computer system for providing a function of extracting, from image data including a pattern, coordinate information on base points for measuring a dimension of a desired portion of the pattern, and measuring the dimension by using the coordinate information on the base points, the computer system comprising:
A dimension measuring method of a computer system extracting coordinate information on base points for measuring a dimension of a desired portion of image data, measuring the dimension by using the coordinate information on the base points, wherein
A semiconductor device manufacturing system provided with a platform in which an application for extracting coordinate information on base points for measuring a dimension of a desired portion of image data, and measuring the dimension by using the coordinate information on the base points is installed, wherein
Dependencies are inferred from the claim text.