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US 12,717,890 B1Granted
Logic built-in self-test (LBIST) circuit for authenticity validation
AssigneeSynopsys, Inc.
InventorsAdam Cron, Michael Borza
Life of this patent
Estimating the term…
Abstract
An example is a method. A query challenging authenticity is received at an intellectual property (IP) block in an integrated circuit (IC) die. The query may be a query of a query-response pair. A response to the query is generated, at the IP block, using a logic built-in self-test (LBIST) circuit. The response is transmitted from the IP block. The response may be received and compared to an expected response of the query-response pair. Authenticity may be validated when the response matches the expected response.
Claims20
A method comprising:
- receiving, at an intellectual property (IP) block in an integrated circuit (IC) die, a query challenging authenticity, the query including a prompt;
- generating, at the IP block, a response to the query using a logic built-in self-test (LBIST) circuit, generating the response including writing the prompt to the LBIST circuit;
- and
- transmitting the response from the IP block.
1 more element
A method comprising:
- transmitting, to an intellectual property (IP) block in an integrated circuit (IC) die, a query of a query-response pair for challenging authenticity, the query including a prompt;
- receiving, from the IP block, a response to the query, the response being generated at the IP block using a logic built-in self-test (LBIST) circuit of the IC die, wherein generating the response includes writing the prompt to the LBIST circuit;
- and
- comparing the response to an expected response of the query-response pair, wherein authenticity is validated when the response matches the expected response.
1 more element
A method comprising:
- transmitting a query of a query-response pair to an intellectual property (IP) block in an integrated circuit (IC) die, the query including a prompt;
- receiving, at the IP block, the query;
- generating, at the IP block, a response to the query using a logic built-in self-test (LBIST) circuit of the IC die, generating the response including writing the prompt to the LBIST circuit;
- receiving, from the IP block, the response;
- and
- comparing the response to an expected response of the query-response pair.
3 more elements
Dependencies are inferred from the claim text.