Method and system for open-loop or closed-loop control of a technical device

A system for open-loop or closed-loop control of a technical device, with an open-loop or closed-loop control facility with at least one initial parameter, through which an open-loop or closed-loop parameter of the technical device is influenceable, the open-loop or closed-loop control facility being configured to create the at least one initial parameter as a function of at least one input parameter, the system comprising:

• a decentralized peripheral station;
• an input unit including a processor and memory;
• a field device;
• and
• an open-loop or closed-loop control facility;
• wherein the input parameter is a predicted future value of a parameter detected in the technical device to compensate, at least in part, for temporal delays between the detection of the parameter and the creation of the initial parameter from the input parameter;
• wherein a value of the parameter detected in the technical device at a first point in time is detected and the at least one predicted future value relates to a second point in time, which lies in the future by a defined or definable period of time in relation to the first point in time;
• and
• wherein the definable period of time is set as a function of a transmission time of the value of the parameter detected in the technical device determined or of the predicted future value of the parameter to an open-loop or closed-loop control facility, which creates the at least one initial parameter as a function of the at least one input parameter.

A method for open-loop or closed-loop control of a technical device, an open-loop or closed-loop parameter of the technical device being influenced by at least one initial parameter, the method comprising:

• creating the at least one initial parameter as a function of at least one input parameter;
• and
• utilizing a predicted future value of a parameter detected in the technical device as the input parameter to compensate, at least in part, for temporal delays between the detection of the parameter and the creation of the initial parameter from the input parameter;
• wherein the value of the parameter detected in the technical device at a first point in time is determined;
• and wherein a plurality of predicted future values, which relate to a number of points in time in the future, which each lie in the future by a different period of time in relation to the first point in time, are created;
• and
• wherein a selection of at least one of the predicted future values of the parameter detected in the technical device as the input parameter is undertaken as a function of a transmission time of the value of the parameter determined or of the predicted future values of the parameter detected in the technical device to an open-loop or closed-loop control facility, which creates the at least one initial parameter as a function of the at least one input parameter.