Using cleaning protocols to monitor defects associated with light detection and ranging (Lidar) devices

A system comprising:

• a light detection and ranging (lidar) device comprising:
• one or more optical components;
• a light emitter configured to emit a series of light signals;
• and
• a light detector configured to detect a series of reflections of the light signals;
• a cleaning device configured to apply a cleaning protocol to the one or more optical components;
• and
• a controller configured to determine, based on the series of detected reflections, that one or more defects are present within the one or more optical components or within the cleaning device, wherein determining that one or more defects are present within the one or more optical components or within the cleaning device comprises:
• generating a plot of intensities of the series of detected reflections of the light signals over time;
• and
• fitting the generated plot to a function.

A computing device configured to:

• receive data corresponding to a series of reflections of light signals detected by a light detector of a light detection and ranging (lidar) device, wherein the series of light signals were emitted by a light emitter of the lidar device in response to a cleaning device applying a cleaning protocol to one or more optical components of the lidar device;
• and
• determine, based on the received data, that one or more defects are present within the one or more optical components or within the cleaning device, wherein determining that one or more defects are present within the one or more optical components or within the cleaning device comprises:
• generating a plot of intensities of the series of detected reflections of the light signals over time;
• and
• fitting the generated plot to a function.