Magnetic particle imaging apparatus
AssigneeMitsubishi Electric Corporation
InventorsKota Nomura, Tetsuya Matsuda, Kazuki Yamauchi
Life of this patent
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Abstract
The magnetic particle imaging apparatus includes: a retaining unit configured to retain an inspection target; a static magnetic field generator configured to generate a linear magnetic field-free region that passes through the inspection target retained by the retaining unit; an AC magnetic field application coil configured to apply an AC magnetic field to the magnetic field-free region; and a detection coil configured to detect a magnetic variation of magnetic particles in the magnetic field-free region as a signal. The retaining unit, the AC magnetic field application coil and the detection coil are movable relative to the static magnetic field generator in the third direction as an integral structure.
Claims20
A magnetic particle imaging apparatus configured to detect magnetic particles in an inspection target, comprising:
- a retaining unit configured to retain the inspection target;
- a static magnetic field generator configured to generate a linear magnetic field-free region that passes through the inspection target retained by the retaining unit;
- an AC magnetic field application coil configured to apply an AC magnetic field to the magnetic field-free region;
- and
- a detection coil configured to detect a magnetic variation of the magnetic particles in the magnetic field-free region as a signal,
- the detection coil having an axis parallel to the direction of the AC magnetic field,
- the relative position of each of the retaining unit, the AC magnetic field application coil and the detection coil being fixed in a direction orthogonal to both the extending direction of the axis and the extending direction of the magnetic field-free region, and
- the retaining unit, the AC magnetic field application coil and the detection coil being movable relative to the static magnetic field generator in the orthogonal direction as an integral structure.
A magnetic particle imaging apparatus configured to detect magnetic particles in an inspection target, comprising:
- a retaining unit configured to retain the inspection target;
- a static magnetic field generator configured to generate a linear magnetic field-free region that passes through the inspection target retained by the retaining unit;
- an AC magnetic field application coil configured to apply an AC magnetic field to the magnetic field-free region;
- and
- a detection coil configured to detect a magnetic variation of the magnetic particles in the magnetic field-free region as a signal,
- the detection coil having an axis parallel to the direction of the AC magnetic field,
- the position of the detection coil relative to the AC magnetic field application coil being fixed in a circumferential direction of the axis,
- among the retaining unit, the AC magnetic field application coil and the detection coil, only the retaining unit being movable in the circumferential direction, and
- the retaining unit, the AC magnetic field application coil and the detection coil are movable, as an integral structure, relative to the static magnetic field generator in an orthogonal direction to both the extending direction of the axis and the extending direction of the magnetic field-free region.
Dependencies are inferred from the claim text.