Method for measuring DC bias aging characteristics of multilayer capacitor
AssigneeSamsung Electro-Mechanics Co., Ltd.
InventorsDong Seuk Kim, Geon Yong Lee, Myung Duk Seo, Dong Hwi Shin
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Abstract
A method for measuring DC bias aging characteristics of a multilayer capacitor includes applying a first poling voltage to a multilayer capacitor including a body having a dielectric layer including a plurality of dielectric grains and an internal electrode disposed alternately with the dielectric layer in a first direction, and an external electrode disposed on the body, maintaining the first poling voltage for a first period of time (t1), applying a DC bias voltage lower than the first poling voltage, maintaining the DC bias voltage for a second period of time (t2), and measuring saturated capacitance after the DC bias voltage is applied.
Claims19
A method for measuring DC bias aging characteristics of a multilayer capacitor, the method comprising:
- applying a first poling voltage to the multilayer capacitor including a body having a dielectric layer including a plurality of dielectric grains and an internal electrode disposed alternately with the dielectric layer in a first direction, and an external electrode disposed on the body;
- maintaining the first poling voltage for a first period of time (t1);
- applying a DC bias voltage, lower than the first poling voltage, to the multilayer capacitor;
- maintaining the DC bias voltage for a second period of time (t2);
- and
- measuring saturated capacitance of the multilayer capacitor,
- wherein the dielectric layer includes a perovskite-based material having a crystal structure represented by a chemical formula ABO3.
A method for measuring DC bias aging characteristics of a multilayer capacitor, the method comprising:
- applying a first poling voltage to the multilayer capacitor including a body having a dielectric layer including a plurality of dielectric grains and an internal electrode disposed alternately with the dielectric layer in a first direction, and an external electrode disposed on the body:
- maintaining the first poling voltage for a first period of time (t1);
- applying a DC bias voltage, lower than the first poling voltage, to the multilayer capacitor;
- maintaining the DC bias voltage for a second period of time (t2);
- and
- measuring saturated capacitance of the multilayer capacitor,
- wherein the first period of time (t1) and the second period of time (t2) are 1 minute or more, respectively.
A method for measuring DC bias aging characteristics of a multilayer capacitor, the method comprising:
- applying a first poling voltage to the multilayer capacitor including a body having a capacitance region in which at least one first internal electrode and at least one second internal electrode are alternately stacked in a first direction with at least one dielectric layer interposed therebetween, and first and second external electrodes disposed on the body to be spaced apart from each other, the first and second external electrodes respectively connected to the at least one first internal electrode and the at least one second internal electrode;
- measuring a first capacitance of the multilayer capacitor to which a DC bias voltage, lower than the first poling voltage, is applied after the first poling voltage is applied;
- applying a second poling voltage, different from the first poling voltage, to the multilayer capacitor;
- measuring a second capacitance of the multilayer capacitor to which the DC bias voltage, lower than the second poling voltage, is applied after the second poling voltage is applied;
- and
- determining, based on the first and second poling voltages and the first and second capacitances, DC bias aging characteristics of the multilayer capacitor.
Dependencies are inferred from the claim text.