Measuring arrangements and methods for the detection of trace gases in a sample gas
AssigneeEndress+Hauser Group Services AG
InventorsTobias Meinert, Benjamin Scherer, Ulrich Hoefer
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AssigneeEndress+Hauser Group Services AG
InventorsTobias Meinert, Benjamin Scherer, Ulrich Hoefer
Estimating the term…
A measuring arrangement for detecting trace gases in a sample gas, the measuring arrangement includes at least one narrow-band excitation light source; first and second chambers, wherein the excitation light is emitted into the chambers; a scrubber, wherein trace gases are removed from the sample gas as it passes between the first and second chambers; at least one narrow-band measurement light source arranged such that the measurement light hits the excitation light in the first chamber and second chambers; a detector unit which is in optical contact with the first and second chambers and detects the measurement light from the first and second chambers and converts it into a first and a second electrical signal; and a data processing unit which calculates the amount of trace gases in the sample gas from the first and second electrical signals. The present disclosure also discloses an alternative measuring arrangement and method.
A measuring arrangement for detecting trace gases in a sample gas, the measuring arrangement comprising:
A measuring arrangement for detecting trace gases in a sample gas, the measuring arrangement comprising:
A method for detecting trace gases in a sample gas, comprising the steps of:
A method for detecting trace gases in a sample gas, comprising the steps of:
Dependencies are inferred from the claim text.