Detection device
AssigneeJapan Display Inc.
InventorsToshinori Uehara, Fumihoru Nakano
Life of this patent
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AssigneeJapan Display Inc.
InventorsToshinori Uehara, Fumihoru Nakano
Estimating the term…
Disclosed herein is a detection device including a sensor substrate including strain sensors arranged on a rectangular flexible substrate at fixed intervals in a longitudinal direction. A curvature radius between a pair of adjacent strain sensors is calculated on a value from a preceding strain sensor of the pair of adjacent sensors. When a start point node is defined as a position of a first strain sensor at one end of the strain sensors, a relative position of each of the strain sensors is determined by sequentially adding the relative positions. When the first and second strain sensors overlap, positions of the first and second strain sensors are considered identical on relative space. A position of each strain sensor is corrected based on a difference between a calculated position of the second strain sensor determined by sequentially adding the relative positions and actual position of the second strain sensor.
A detection device comprising:
A detection device comprising:
Dependencies are inferred from the claim text.