US 12,714,855 B2 · Capacitor testing for implantable stimulators

Abstract

Examples disclosed herein are relevant to testing capacitors to identify potentially faulty DC blocking capacitors in implantable stimulators. In an example, the test includes selecting an active electrode, a return electrode, and a reference electrode. Short duration monophasic stimulation is used to charge up the DC blocking capacitors of the active and return electrodes. The electrodes are subsequently disconnected from all other nodes except a discharge circuit (e.g., a star circuit) and the tissue. The reference electrode is used to measure the voltage of the DC blocking capacitor of the active electrode during the charging phase and the discharging phase (via the discharge circuit). The characteristics of one or more of the capacitors charging or discharging can be sensed and then analyzed to determine whether the one or more capacitors are functioning properly. Faulty capacitors can be identified by comparing actual and expected characteristics.

Claims20

Dependent claims

A method comprising:

selecting one or more electrodes of a plurality of electrodes of an implantable stimulator as an active electrode set for testing one or more active electrode capacitors associated with the active electrode set;
selecting one or more electrodes of the plurality of electrodes as a return electrode set for testing the one or more active electrode capacitors associated with the active electrode set;
charging the one or more active electrode capacitors associated with the active electrode set;
charging one or more return electrode capacitors associated with the return electrode set;
disconnecting the return electrode set, the active electrode set, the one or more active electrode capacitors, and the one or more return electrode capacitors from a stimulation source;
after disconnecting, measuring one or more characteristics of the one or more active electrode capacitors during discharge of the one or more active electrode capacitors;
and
determining a health of one or more of the one or more active electrode capacitors based on the one or more characteristics.

5 more elements

An implantable stimulator comprising:

a stimulation source;
a plurality of electrode subcircuits, each respective electrode subcircuit having:
a capacitor,
an electrode connected in series to the capacitor and being configured to deliver stimulation to tissue using the stimulation source, and
a switch connected to the capacitor and configured to selectively couple the capacitor with the stimulation source;
a discharge circuit connected to each of the plurality of electrode subcircuits;
and
one or more processors configured to test, during a power-on process of the implantable stimulator or during a fitting of the implantable stimulator, a health status of a respective capacitor of a respective electrode subcircuit of the plurality of electrode subcircuits via a test,
wherein the test includes:
charging the respective capacitor;
designating an electrode subcircuit of the plurality of electrode subcircuits as a return electrode subcircuit;
charging a return capacitor associated with the return electrode subcircuit;
disconnecting the respective capacitor and the return capacitor from the stimulation source;
determining discharge characteristics of the respective capacitor while discharging via the discharge circuit;
and
determining the health status of the respective capacitor based on the discharge characteristics.

13 more elements

Dependencies are inferred from the claim text.

Capacitor testing for implantable stimulators

Life of this patent

Capacitor testing for implantable stimulators

Life of this patent

Abstract

Claims20