3D fan-out packaging structure of interconnection system with ultra-high density and method for manufacturing the same
AssigneeSJ Semiconductor(Jiangyin) Corporation
InventorsYenheng Chen, Chengchung Lin
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AssigneeSJ Semiconductor(Jiangyin) Corporation
InventorsYenheng Chen, Chengchung Lin
Estimating the term…
A 3D fan-out packaging structure of an interconnection system with ultra-high density and a method for manufacturing the same are disclosed; the packaging structure includes a first insulating layer, first metal solder pads, a metal pillar, a first chip, a second insulating layer, second metal solder pads, a first encapsulating layer, a first rewiring layer, a second chip, a second encapsulating layer, a second rewiring layer, and a solder ball. The packaging structure adopts the “RDL first” process, and non-soldering interfaces between the first and second metal solder pads help achieve bonding with a spacing of 5-10 μm or even less, much smaller than conventional soldering spacings, thus increasing the number of available I/O ports and obtaining a high-density, highly integrated packaging structure. In addition, in the present disclosure, various chips and electronic components can be integrated together, thereby achieving high-performance system-level packaging with higher flexibility and compatibility.
A method for manufacturing a 3D fan-out packaging structure of an interconnection system with ultra-high density, comprising:
Dependencies are inferred from the claim text.