Methods for patterning substrates to adjust voltage properties
AssigneeApplied Materials, Inc.
InventorsSteven C. H. Hung, Srinivas Gandikota, Yixiong Yang, Yong Yang
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AssigneeApplied Materials, Inc.
InventorsSteven C. H. Hung, Srinivas Gandikota, Yixiong Yang, Yong Yang
Estimating the term…
A method of forming a structure on a substrate is provided. The method includes depositing a dipole dopant containing (DDC) layer including a dipole dopant on a first and second region of a dielectric layer (DL) of the substrate. A hardmask (HM) is deposited over the DDC deposited on the first and the second regions. A patterned photoresist layer (PR) is formed over the HM. The PR includes a first portion that is positioned over the first region and an opening that is positioned to expose a portion of the HM that is disposed over the second region of the substrate. The HM and DDC within the second region are etched and at least a portion of the DL is exposed within the second region. The PR is removed and the substrate is annealed to diffuse the dipole dopant into a portion of the DL disposed in the first region.
A method of forming a structure on a substrate, the method comprising:
A method of forming a structure on a substrate, the method comprising:
Dependencies are inferred from the claim text.