Three-dimensional sample scanning system

A system for scanning a sample comprising:

• a sample holder configured to hold a sample;
• an optical device comprising a light source for emitting light towards the sample holder, an emitted light filter plate comprising a first array of filters, and a scattered light filter plate comprising a second array of filters;
• a base element comprising a first case extending along an optical path of the light emitted by the light source towards the sample holder and a second case extending along an optical path of light scattered by a sample held in the sample holder;
• wherein the emitted light filter plate is positioned along the optical path of the emitted light and the scattered light filter plate is positioned along the optical path of the scattered light;
• and
• wherein the first case is fixed with respect to the second case;
• first displacement means coupled to at least one of the optical device and the base element for relatively moving the emitted light filter plate and the scattered light filter plate of the optical device with respect to the base element along a first direction;
• and
• second displacement means, which is distinct from the first displacement means and is coupled to at least one of the base element and the sample holder for relatively moving the base element and the sample holder with respect to each other along the first direction, such that the optical path of the emitted light moves with respect to a sample held in the sample holder.