Semiconductor device, method for manufacturing the semiconductor device, and power conversion device
AssigneeHitachi Power Semiconductor Device, Ltd.
InventorsTomoyasu Furukawa, Tomoyuki Miyoshi
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AssigneeHitachi Power Semiconductor Device, Ltd.
InventorsTomoyasu Furukawa, Tomoyuki Miyoshi
Estimating the term…
A MOS control diode obtained by adding a MOS control function to a PN diode, comprises: a semiconductor substrate having a PN junction diode that consists of a conductivity-type drift layer and a conductivity-type anode layer; a first conductivity-type well layer on the anode layer; a second conductivity-type low-concentration source layer on the well layer; a second conductivity-type high-concentration source layer only on a portion of the low-concentration source layer; gate electrodes that are located adjacent to, by way of gate oxide films, the anode layer, the well layer, and the low-concentration source layer, and that constitutes a MOSFET; an insulating film that covers the anode layer, the low-concentration and high-concentration source layers, and the gate electrodes; and a contact hole that penetrates the insulating film, the well layer, and the low-concentration and high-concentration source layers.
A semiconductor device comprising:
Dependencies are inferred from the claim text.