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US 12,706,289 B2Granted
Sample support
AssigneeHamamatsu Photonics K.K.
InventorsAkira Tashiro, Takayuki Ohmura, Masahiro Kotani, Takamasa Ikeda
Life of this patent
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Abstract
A sample support used for sample component ionization includes: a substrate having a first surface and a plurality of holes opening to the first surface; and a conductive layer provided on the first surface so as not to block the hole, in which the conductive layer is configured by a plurality of nanoparticles and has a thickness of 30 nm or more.
Claims10
A sample support used for sample component ionization, the sample support comprising:
- a substrate having a first surface and a plurality of holes opening to the first surface;
- and
- a conductive layer provided on the first surface so as not to block the hole,
- wherein the conductive layer is configured by a plurality of nanoparticles connected to each other to form the conductive layer and has a thickness of 30 nm or more, and
- wherein the conductive layer has nanosized irregularities on its outermost surface.
2 more elements
A sample support used for sample component ionization, the sample support comprising:
- a substrate having a first surface and a plurality of holes opening to the first surface;
- and
- a conductive layer provided on the first surface so as not to block the hole,
- wherein the conductive layer is configured by a plurality of nanoparticles and has a thickness of 30 nm or more,
- the substrate has a second surface on a side opposite to the first surface,
- each of the plurality of holes penetrates the substrate from the first surface to the second surface, and
- the conductive layer has nanosized irregularities on its outermost surface.
4 more elements
Dependencies are inferred from the claim text.