Partially good block handling in a memory device
AssigneeMicron Technology, Inc.
InventorsYu-Chung Lien, Jiangli Zhu, Zhenming Zhou
Life of this patent
Estimating the term…
Abstract
A programming failure is detected at a block of a memory device. Based on detecting the programming failure, the block is determined to be partially good based on a number of failed bytes in the block. An unfailing portion of the block is identified in response to determining the block is partially good. A record indicating the block is partially good and identifying the unfailing portion of the block is stored.
Claims20
A memory sub-system comprising:
- a memory device;
- and
- a processing device, operatively coupled with the memory device, configured to perform operations comprising:
- detecting a programming failure at a block of the memory device, the block comprising a central row decoder that divides the block into a first half and a second half;
- based on detecting the programming failure, determining the block is partially good based on a number of failed bytes in the block;
- identifying an unfailing half of the block in response to determining the block is partially good;
- storing a record indicating the block is partially good and identifying the unfailing half of the block;
- receiving a command to perform a data operation on the block;
- accessing the record in response to the command;
- based on the command indicating the block is partially good, disabling a failed half of the block, the disabling of the failed half of the block comprising disabling one or more switch transistors of the central row decoder that correspond to the failed half of the block;
- and
- executing the data operation on the unfailing half of the block while the failed half of the block is disabled.
A method comprising:
- executing, by a processing device, a program command on a block of a memory device, the block of the memory device comprising a central row decoder that devices the block into a first half and a second half;
- detecting, by the processing device, a programming failure at the block of the memory device based on executing the program command;
- based on detecting the programming failure, determining, by the processing device, the block is partially good based on a number of failed bytes in the block;
- identifying, by the processing device, the first half or the second half as an unfailing half of the block in response to determining the block is partially good;
- storing, by the processing device, a record indicating the block is partially good and identifying the unfailing half of the block;
- receiving a command to perform a data operation on the block;
- accessing the record in response to the command;
- based on the command indicating the block is partially good, disabling a failed half of the block, the disabling of the failed half of the block comprising disabling one or more switch transistors of the central row decoder that correspond to the failed half of the block;
- and
- executing the data operation on the unfailing half of the block while the failed half of the block is disabled.
A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device, configure the processing device to perform operations comprising:
- detecting a programming failure at a block of a memory device, the block of the memory device comprising a central row decoder that horizontally divides the block into a first half and a second half;
- based on detecting the programming failure, determining the block is partially good based on a number of failed bytes in the block;
- determining the first half of the block is an unfailing half of the block in response to determining the block is partially good;
- storing a record indicating the block is partially good and identifying the first half as the unfailing half of the block;
- receiving a command to perform a data operation on the block;
- accessing the record in response to the command;
- based on the command indicating the block is partially good, disabling a failed half of the block, the disabling of the failed half of the block comprising disabling one or more switch transistors of a row decoder that correspond to the failed half of the block;
- and
- executing the data operation on the unfailing half of the block while the failed half of the block is disabled.
Dependencies are inferred from the claim text.