Method and apparatus for testing a semiconductor device

A test apparatus for testing a semiconductor device, wherein the semiconductor device comprises a plurality of ground terminals, and the test apparatus comprises:

• a plurality of ground contacts configured for coupling to the plurality of ground terminals of the semiconductor device respectively;
• and
• a detection module having a plurality of inputs coupled to the plurality of ground contacts respectively, and configured to detect electrical conditions at the plurality of ground contacts;
• wherein, when the semiconductor device is mounted on the test apparatus for testing, a first signal is generated at an output of the detection module if all of the plurality of ground contacts are coupled to the plurality of ground terminals of the semiconductor device, and a second signal different from the first signal is generated at the output of the detection module if at least one of the plurality of ground contacts is not coupled to the plurality of ground terminals of the semiconductor device;
• and
• wherein the semiconductor device comprises a power terminal, the test apparatus comprises a power contact configured for coupling to the power terminal of the semiconductor device, and the test apparatus further comprises:
• a control module coupled between the output of the detection module and the power contact of the test apparatus, wherein the control module is configured to apply an external power supply on the power contact of the test apparatus when receiving the first signal from the output of the detection module.