Resonance inspection system and method for using same
AssigneeRtx Corporation
InventorsRonald B. Coleman, Alan R. Curtis
Life of this patent
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AssigneeRtx Corporation
InventorsRonald B. Coleman, Alan R. Curtis
Estimating the term…
A resonance inspection system a processing system configured to process resonance data including a vibratory response signature of a component over a portion of a frequency range of the vibratory response signature to generate a plurality of different resonance spectra waveforms of the vibratory response signature. The plurality of different resonance spectra waveforms includes a first resonance spectra waveform and a second resonance spectra waveform. The processing system is further configured to detrend the first resonance spectra waveform and the second resonance spectra waveform and identify a presence or an absence of a structural mode of the component using the first resonance spectra waveform and the second resonance spectra waveform. The presence of the structural mode is identified by determining the first resonance spectra waveform includes a maximum slope point at a first frequency of the portion of the frequency range and the second resonance spectra waveform includes a second peak at a second frequency of the portion of the frequency range.
A resonance inspection system comprising:
A method for identifying a presence or an absence of a structural mode of a component for an aircraft propulsion system with a resonance inspection system, the method comprising:
Dependencies are inferred from the claim text.