Refrigeration chip, refrigeration system, and sample testing system and method

Abstract

The embodiments of the present disclosure disclose a refrigeration chip, a refrigeration system, and a sample testing system and method. The refrigeration chip is in contact with a low-temperature cold source, is used for refrigerating a sample, and comprises a heating layer and a heat conducting layer that are disposed in sequence. The heating layer comprises at least one temperature control unit that is disposed on the heat conducting layer; and the heat generated by the temperature control unit is transferred to the low-temperature cold source along the thickness direction of the heat conducting layer. The described technology enables a particular time period to be selected for refrigeration and thawing during the in-situ observation and representation of a sample, and refrigeration and heating rates higher than 105° C./s are attained by means of an interface thermal resistance design, thus ensuring that the sample is not damaged. The described technology is a significant improvement to operations related to the refrigeration, thawing, in-situ microscopic observation and so on of biological samples, and has great significance and broad application prospects.

Dependencies are inferred from the claim text.