Method for local modification of etching resistance in a silicon layer, use of this method in the production of passivation contact solar cells and thus-created solar cell
AssigneeInternational Solar Energy Research Center Konstanz E.V.
InventorsFlorian Buchholz, Jan Hoss, Haifeng Chu, Jan Lossen, Valentin Dan Mihailetchi
Life of this patent
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Abstract
Provided are a method for local structuring of a silicon layer, which method comprises a step of local modification of the etching resistance within said silicon layer and a subsequent step of removing unmodified regions of said silicon layer by etching and applications of this method for the production of solar cells.
Claims19
A method for local structuring of a silicon layer to produce locally structured polycrystalline layers (301,1301,1302),
- characterized in that
- the method comprises a step of local modification of the etching resistance within said silicon layer (301,1301,1302) and a subsequent step of removing unmodified regions of said silicon layer (301,1301,1302) by etching,
- wherein the local modification of the etching resistance of the silicon layer (301,1301,1302) is brought about at least partly by application of a laser to those regions of the silicon layer (301,1301,1302) in which the etching resistance is increased,
- wherein the local modification of the etching resistance is brought about at least partly by inducing a local increase in the crystallinity of the silicon layer (301,1301,1302) in the modified regions to produce locally structured polycrystalline layers, and
- wherein the laser that is used is a short pulse ultraviolet light laser, and wherein the pulse energy is being selected such that a local increase in the crystallinity of the silicon layer (301,1301,1302) and diffusion or activation of dopants, in case dopants are present, occurs, but an underlying layer remains unaffected.
A method for local structuring of a silicon layer to produce locally structured polycrystalline layers (301,1301,1302),
- characterized in that
- the method comprises a step of local modification of the etching resistance within said silicon layer (301,1301,1302) and a subsequent step of removing unmodified regions of said silicon layer (301,1301,1302) by etching,
- wherein the local modification of the etching resistance of the silicon layer (301,1301,1302) is brought about at least partly by application of a laser to those regions of the silicon layer (301,1301,1302) in which the etching resistance is increased,
- wherein the local modification of the etching resistance is brought about at least partly by inducing a local increase in the crystallinity of the silicon layer (301,1301,1302) in the modified regions to produce locally structured polycrystalline layers, and
- wherein the laser that is used is a short pulse ultraviolet light excimer laser, and wherein the pulse energy is being selected such that a local increase in the crystallinity of the silicon layer (301,1301,1302) and diffusion or activation of dopants, in case dopants are present, occurs, but an underlying layer remains unaffected.
Dependencies are inferred from the claim text.