Binocular disparity correction system
AssigneeMeta Platforms Technologies, LLC
InventorsDong Zhang, Yujia Huang, Peicong Wu, Turhan Karadeniz, Vadim Goncharuk
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Abstract
The disclosed computer-implemented method may include displaying a first test pattern on a first display and a second test pattern on a second display and capturing the displayed first test pattern and the displayed second test pattern. The method may further include determining a deviation between at least one of the captured first test pattern and the first test pattern or the captured second test pattern and the second test pattern. The method may also include adjusting output to at least one of the first display or the second display based on the determined deviation. Various other methods, systems, and computer-readable media are also disclosed.
Claims20
A computer-implemented method comprising:
- generating a first test pattern and a second test pattern, wherein feature locations of the first test pattern are high-probabilistically different from feature locations of the second test pattern;
- displaying the first test pattern on a first display and the second test pattern on a second display;
- capturing the displayed first test pattern and the displayed second test pattern simultaneously from the first display and the second display in a combined image;
- determining a deviation between at least one of the captured first test pattern from the combined image and the first test pattern or the captured second test pattern from the combined image and the second test pattern;
- and
- adjusting output to at least one of the first display or the second display based on the determined deviation.
A system comprising:
- at least one physical processor;
- a first display;
- a second display;
- an image sensor device;
- and
- physical memory comprising computer-executable instructions that, when executed by the physical processor, cause the physical processor to:
- generate a first test pattern and a second test pattern, wherein feature locations of the first test pattern are high-probabilistically different from feature locations of the second test pattern;
- display the first test pattern on the first display and the second test pattern on the second display;
- capture, using the image sensor device, the displayed first test pattern and the displayed second test pattern simultaneously from the first display and the second display in a combined image;
- determine a deviation between at least one of the captured first test pattern from the combined image and the first test pattern or the captured second test pattern from the combined image and the second test pattern;
- and
- adjust output to at least one of the first display or the second display based on the determined deviation.
A non-transitory computer-readable medium comprising one or more computer-executable instructions that, when executed by at least one processor of a computing device, cause the computing device to:
- generate a first test pattern and a second test pattern, wherein feature locations of the first test pattern are high-probabilistically different from feature locations of the second test pattern;
- display a first test pattern on a first display and a second test pattern on a second display;
- capture the displayed first test pattern and the displayed second test pattern simultaneously from the first display and the second display in a combined image;
- determine a deviation between at least one of the captured first test pattern from the combined image and the first test pattern or the captured second test pattern from the combined image and the second test pattern;
- and
- adjust output to at least one of the first display or the second display based on the determined deviation.
Dependencies are inferred from the claim text.