Method, apparatus, and system with abnormality determination

A processor-implemented method of an apparatus or system, comprising:

• obtaining an expert classification criterion from a memory of the apparatus or system;
• converting manufacturing process data associated with a manufacturing process to a test sample in a form of an image;
• generating, using a machine learning model provided with the test sample and based on the expert classification criterion for an anomaly in the manufacturing process, a probability value that the test sample corresponds to a target class representing the anomaly;
• and
• identifying, by classifying the anomaly based on the generated probability value, whether a final abnormality in the manufacturing process has occurred.

An apparatus, comprising:

• one or more processors configured to:
• convert manufacturing process data to a test sample in a form of an image;
• generate, using a machine learning model provided with the test sample, a probability value that the test sample corresponds to a target class representing an anomaly occurring in the manufacturing process;
• adjust the probability value based on a classification criterion of an expert for the anomaly;
• and
• identify, by classifying the anomaly based on the adjusted probability value, whether the abnormality in the manufacturing process has occurred.