Onium salt, resist composition, and patterning process
AssigneeShin-Etsu Chemical Co., Ltd.
InventorsMasahiro Fukushima, Jun Hatakeyama, Tomomi Watanabe, Kazuhiro Katayama
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AssigneeShin-Etsu Chemical Co., Ltd.
InventorsMasahiro Fukushima, Jun Hatakeyama, Tomomi Watanabe, Kazuhiro Katayama
Estimating the term…
Provided is a novel onium salt used for a resist composition that has high sensitivity and excellent resolution, improved LWR and CDU, and that can inhibit collapse of a resist pattern for both of positive-type and negative-type resists in lithography: an onium salt represented by the following general formula (1), wherein RALU represents any one of a tertiary ether, tertiary carbonate, or acetal formed together with the adjacent oxygen atom and having a cyclic structure; RF represents any one of a fluorine atom, a fluorine-containing alkyl group having 1 to 6 carbon atoms, and a nitro group; Ra represents a hydrocarbyl group having 1 to 20 carbon atoms; n1 represents an integer of 0 or 1; n2 and n3 represent an integer of 1 or 2; one of RF and one of —O—RALU are bonded to carbon atoms adjacent to each other; n4 represents an integer of 0 to 3; and Z+ represents an onium cation.
An onium salt represented by the following general formula (1),
Dependencies are inferred from the claim text.