Inspection system and inspection method

An inspection system, comprising:

• at least one ray source configured to emit X-rays, wherein the at least one ray source is rotatable between at least two scanning positions around a rotation axis, each ray source comprises a separate housing to define a vacuum space and comprises a plurality of target spots enclosed within the housing, a rotation angle of the at least one ray source between two adjacent scanning positions is greater than an angle of adjacent target spots of each ray source relative to the rotation axis;
• a detector assembly configured to receive X-rays emitted from the at least one ray source and passing through an inspection region of the inspection system;
• and
• a conveying device configured to carry an object to be inspected,
• wherein the at least one ray source and the detector assembly are movable in a traveling direction relative to the conveying device, so that the object to be inspected enters the inspection region, and the traveling direction is parallel to the rotation axis;
• and
• wherein the inspection system is configured such that:
• the at least one ray source and the detector assembly move in the traveling direction relative to the conveying device and the at least one ray source emits X-rays, when the at least one ray source is located at one of the plurality of scanning positions;
• and the at least one ray source rotates around the rotation axis to another one of the plurality of scanning positions, after the at least one ray source and the detector assembly move a predetermined distance in the traveling direction relative to the conveying device.