Probe for measuring a signal and a reference signal and method of manufacturing a probe for measuring a signal and a reference signal
AssigneeRohde & Schwarz GmbH & Co. KG
InventorsFranz Strasser, Andreas Ziegler, Stefan Ketzer
Life of this patent
Estimating the term…
Abstract
Embodiments of the present disclosure relate to a probe for measuring a signal and a reference signal. The probe comprises a metal body that encompasses a reference socket. The reference socket is in electrical connection with the metal body for measuring the reference signal. The probe comprises a pin that is arranged electrically isolated from the metal body. The pin has an abutting surface capable of contacting a device under test. Further, embodiments of the present disclosure relate to a method of manufacturing a probe for measuring a signal and a reference signal.
Claims18
A probe for measuring a signal and a reference signal, wherein the probe comprises:
- a metal body that encompasses a reference socket, wherein the reference socket is in electrical connection with the metal body for measuring the reference signal;
- a pin arranged to be electrically isolated from the metal body, wherein the pin has an abutting surface capable of contacting a device under test;
- and
- an electrically isolating end part that is located at an end portion of the probe at which an opening of the reference socket is provided, wherein the electrically isolating end part has at least one protrusion that extends in parallel to the pin,
- wherein an electrically isolating body member at least partially overlaps with the at least one protrusion.
A probe for measuring a signal and a reference signal, the probe comprising:
- a metal body that encompasses a reference socket, wherein the reference socket is in electrical connection with the metal body for measuring the reference signal;
- a pin arranged to be electrically isolated from the metal body, wherein the pin has an abutting surface capable of contacting a device under test;
- a seal made of an electrically non-conductive material,
- wherein the seal is a ring having an inner diameter that is smaller than a diameter of a main portion of the pin or larger than a diameter of a tip of the pin, or
- wherein the seal is located between an electrically isolating end part and an electrically isolating body member that accommodates the pin, or
- wherein the sealing is placed within a ring-shaped protrusion of an electrically isolating end part, which extends in parallel to the pin.
A probe for measuring a signal and a reference signal, the probe comprising:
- a metal body that encompasses a reference socket, wherein the reference socket is in electrical connection with the metal body for measuring the reference signal;
- a pin arranged to be electrically isolated from the metal body, wherein the pin has an abutting surface capable of contacting a device under test;
- a spring that interacts with the pin such that the pin is movably located within the probe, wherein the pin has an initial state and a pushed state into which the pin is pushed when the device under test is probed by the probe;
- and
- a shell in which the spring is located and in which the pin is at least partly located such that the shell guides the movable pin when the pin is moved, and wherein the shell provides a stop for the spring or the movable pin.
Dependencies are inferred from the claim text.