Method and apparatus for calculating signal quality value according to reference signal and signal under test that is derived from predetermined signal processing of reference signal
AssigneeAiroha Technology Corp.
InventorsJeng-Hong Chen, Yun-Xuan Zhang
Life of this patent
Estimating the term…
Abstract
A signal quality measurement apparatus includes a processing circuit and a signal quality measurement circuit. The processing circuit receives a reference signal from a first circuit and a signal under test from a second circuit, and refers to the reference signal to derive a signal after processing from the signal under test, wherein the signal under test is derived from predetermined signal processing of the reference signal. The signal quality measurement circuit calculates a signal quality value according to the reference signal and the signal after processing.
Claims18
A signal quality measurement apparatus comprising:
- a processing circuit, arranged to receive a reference signal from a first circuit and a signal under test from a second circuit, and refer to the reference signal to derive a signal after processing from the signal under test, wherein the signal under test is derived from predetermined signal processing of the reference signal;
- and
- a signal quality measurement circuit, arranged to calculate a signal quality value according to the reference signal and the signal after processing;
- wherein the reference signal comprises a plurality of first samples at a first sampling rate, the signal under test comprises a plurality of second samples at a second sampling rate that is different from the first sampling rate, and the processing circuit comprises:
- a sampling rate conversion circuit, arranged to perform a sampling rate conversion operation upon the signal under test to generate a re-sampled signal under test, wherein the re-sampled signal under test comprises a plurality of third samples at the first sampling rate;
- and
- a follow-up processing circuit, arranged to derive the signal after processing from the re-sampled signal under test according to the reference signal.
A signal quality measurement apparatus comprising:
- a processing circuit, arranged to receive a reference signal from a first circuit and a signal under test from a second circuit, and refer to the reference signal to derive a signal after processing from the signal under test, wherein the signal under test is derived from predetermined signal processing of the reference signal;
- and
- a signal quality measurement circuit, arranged to calculate a signal quality value according to the reference signal and the signal after processing;
- wherein the reference signal comprises a plurality of first samples at a sampling rate, the signal after processing comprises a plurality of second samples at the sampling rate, and the signal quality computation circuit comprises:
- a matching gain estimation circuit, arranged to find an optimal matching gain for the signal after processing according to the plurality of first samples and the plurality of second samples;
- an adjustment circuit, arranged to apply the optimal matching gain to the plurality of second samples included in the signal after processing, to generate a plurality of gain-adjusted samples, respectively;
- and
- a calculation circuit, arranged to calculate the signal quality value according to the plurality of first samples and the plurality of gain-adjusted samples.
A signal quality measurement method comprising:
- receiving a reference signal from a first circuit and a signal under test from a second circuit, wherein the signal under test is derived from predetermined signal processing of the reference signal;
- referring to the reference signal to derive a signal after processing from the signal under test;
- and
- calculating a signal quality value according to the reference signal and the signal after processing;
- wherein the reference signal comprises a plurality of first samples at a first sampling rate, the signal under test comprises a plurality of second samples at a second sampling rate that is different from the first sampling rate, and referring to the reference signal to derive the signal after processing from the signal under test comprises:
- performing a sampling rate conversion operation upon the signal under test to generate a re-sampled signal under test, wherein the re-sampled signal under test comprises a plurality of third samples at the first sampling rate;
- and
- deriving the signal after processing from the re-sampled signal under test according to the reference signal.
A signal quality measurement method comprising:
- receiving a reference signal from a first circuit and a signal under test from a second circuit, wherein the signal under test is derived from predetermined signal processing of the reference signal;
- referring to the reference signal to derive a signal after processing from the signal under test;
- and
- calculating a signal quality value according to the reference signal and the signal after processing:
- wherein the reference signal comprises a plurality of first samples at a sampling rate, the signal after processing comprises a plurality of second samples at the sampling rate, and calculating the signal quality value according to the reference signal and the signal after processing comprises:
- finding an optimal matching gain for the signal after processing according to the plurality of first samples and the plurality of second samples;
- applying the optimal matching gain to the plurality of second samples included in the signal after processing, to generate a plurality of gain-adjusted samples, respectively;
- and
- calculating the signal quality value according to the plurality of first samples and the plurality of gain-adjusted samples.
Dependencies are inferred from the claim text.