Collision cross section measurement in time-of-flight mass analyser
AssigneeThermo Fisher Scientific (Bremen) GmbH
InventorsHamish Stewart, Dmitry Grinfeld
Life of this patent
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Abstract
A time-of-flight (ToF) mass analyser determines mass to charge ratio (m/z) of ions by determining flight times along an ion path. In first and second modes of operation, flight times of the ions along the ion path are determined to obtain respective first and second sets of data. In the first and second modes, the ion path has first and second path lengths and the paths are maintained at first and second pressures, respectively, wherein the first and second path lengths and/or the first and second pressures are different. An ion peak in the first set of data is compared to a corresponding ion peak in the second set of data, and a collision cross section of the associated ions is determined based on the comparison.
Claims21
A method of operating a time-of-flight (ToF) mass analyser that is configured to determine a mass to charge ratio (m/z) of ions by determining flight times of ions along an ion path, the method comprising:
- operating the time-of-flight (ToF) mass analyser in a first mode of operation, and analysing ions by determining flight times of the ions along the ion path so as to obtain a first set of data, wherein in the first mode of operation (i) the ion path has a first path length, and (ii) the ion path is maintained at a first pressure;
- operating the time-of-flight (ToF) mass analyser in a second mode of operation, and analysing ions by determining flight times of the ions along the ion path so as to obtain a second set of data, wherein in the second mode of operation (i) the ion path has a second path length, and (ii) the ion path is maintained at a second pressure, wherein the second path length is different to the first path length and/or the second pressure is different to the first pressure;
- comparing an intensity of an ion peak in the first set of data to an intensity of a corresponding ion peak in the second set of data;
- and
- determining, based on the comparison and using a calibration for the time-of-flight (ToF) mass analyser, a collision cross section (CCS) of ions associated with the corresponding ion peaks.
A method of operating a time-of-flight (ToF) mass analyser that is configured to determine a mass to charge ratio (m/z) of ions by determining flight times of ions along an ion path, the method comprising:
- operating the time-of-flight (ToF) mass analyser in a first mode of operation, and analysing ions by determining flight times of the ions along the ion path so as to obtain a first set of data, wherein in the first mode of operation (i) the ion path has a first path length, and (ii) the ion path is maintained at a first pressure;
- operating the time-of-flight (ToF) mass analyser in a second mode of operation, and analysing ions by determining flight times of the ions along the ion path so as to obtain a second set of data, wherein in the second mode of operation (i) the ion path has a second path length, and (ii) the ion path is maintained at a second pressure, wherein the second path length is different to the first path length and/or the second pressure is different to the first pressure;
- comparing an intensity of an ion peak in the first set of data to an intensity of a corresponding ion peak in the second set of data;
- determining, based on the comparison, a collision cross section (CCS) of ions associated with the corresponding ion peaks;
- and
- operating the time-of-flight (ToF) mass analyser in a mass analysis mode of operation, wherein in the mass analysis mode of operation the ion path is maintained at a third pressure, wherein the third pressure is less than the first and second pressures.
A method of determining a calibration for a time-of-flight (ToF) mass analyser that is configured to determine a mass to charge ratio (m/z) of ions by determining flight times of ions along an ion path, the method comprising:
- operating the time-of-flight (ToF) mass analyser in a first mode of operation, and analysing calibrant ions by determining flight times of the calibrant ions along the ion path so as to obtain a first set of data, wherein in the first mode of operation (i) the ion path has a first path length, and (ii) the ion path is maintained at a first pressure;
- operating the time-of-flight (ToF) mass analyser in a second mode of operation, and analysing calibrant ions by determining flight times of the calibrant ions along the ion path so as to obtain a second set of data, wherein in the second mode of operation (i) the ion path has a second path length, and (ii) the ion path is maintained at a second pressure, wherein the second path length is different to the first path length and/or the second pressure is different to the first pressure;
- determining a plurality of ratios, wherein each ratio is a ratio of an intensity of an ion peak in the first set of data to an intensity of a corresponding ion peak in the second set of data;
- and
- using each ratio together with a known collision cross section (CCS) value for calibrant ions associated with that ratio to determine a calibration for the time-of-flight (ToF) mass analyser.
An analytical instrument comprising:
- a time-of-flight (ToF) mass analyser configured to determine the a mass to charge ratio (m/z) of ions by determining flight times of ions along an ion path;
- and
- a control system configured to:
- operate the time-of-flight (ToF) mass analyser in a first mode of operation, and analyse ions by determining flight times of the ions along the ion path so as to obtain a first set of data, wherein in the first mode of operation (i) the ion path has a first path length, and (ii) the ion path is maintained at a first pressure;
- operate the time-of-flight (ToF) mass analyser in a second mode of operation, and analyse ions by determining flight times of the ions along the ion path so as to obtain a second set of data, wherein in the second mode of operation (i) the ion path has a second path length, and (ii) the ion path is maintained at a second pressure, wherein the second path length is different to the first path length and/or the second pressure is different to the first pressure;
- compare an intensity of an ion peak in the first set of data to an intensity of a corresponding ion peak in the second set of data;
- and
- determine, based on the comparison and using a calibration for the time-of-flight (ToF) mass analyser, a collision cross section (CCS) of the ions associated with the corresponding ion peaks.
An analytical instrument comprising:
- a mass analyser configured to determine a mass to charge ratio (m/z) of ions by determining flight times of ions along an ion path;
- and
- a control system configured to:
- operate the mass analyser in a first mode of operation, and analyse ions by determining flight times of the ions along the ion path so as to obtain a first set of data, wherein in the first mode of operation (i) the ion path has a first path length, and (ii) the ion path is maintained at a first pressure;
- operate the mass analyser in a second mode of operation, and analyse ions by determining flight times of the ions along the ion path so as to obtain a second set of data, wherein in the second mode of operation (i) the ion path has a second path length, and (ii) the ion path is maintained at a second pressure, wherein the second path length is different to the first path length and/or the second pressure is different to the first pressure;
- compare an intensity of an ion peak in the first set of data to an intensity of a corresponding ion peak in the second set of data;
- and
- determine, based on the comparison, a collision cross section (CCS) of the ions associated with the corresponding ion peaks,
- wherein the control system is further configured to:
- operate the mass analyser in a mass analysis mode of operation, wherein in the mass analysis mode of operation the ion path is maintained at a third pressure, wherein the third pressure is less than the first and second pressures.
Dependencies are inferred from the claim text.