Managing beam power effects by varying base emissivity
AssigneeApplied Materials, Inc.
InventorsDawei Sun, Eric D. Hermanson, Benjamin E. Heneveld
Life of this patent
Estimating the term…
Loading patent…
AssigneeApplied Materials, Inc.
InventorsDawei Sun, Eric D. Hermanson, Benjamin E. Heneveld
Estimating the term…
A workpiece mounting system comprising a chuck and a base is disclosed. The emissivity of the base is increased to allow more heat transfer from the chuck to the base. In some embodiments, the emissivity of the base may be controllable so that for ion beams with lower power levels, the emissivity remains low, enabling the chuck to reach the desired temperature quickly. For ion beams with higher power levels, the emissivity may increase to allow more heat transfer to the base, allowing the chuck to maintain the desired temperature. High emissivity coatings may be applied to the top surface of the base. In other embodiments, a set of movable shields may be disposed between the chuck and the base. The position of the shields may be a function of the power level of the incoming ion beam.
A system for mounting and heating a workpiece, comprising:
A system for mounting and heating a workpiece, comprising:
A system for mounting and heating a workpiece, comprising:
Dependencies are inferred from the claim text.