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US 12,693,446 B2Granted
Inspection system
AssigneeKabushiki Kaisha Toshiba
InventorHiroki Mori
Life of this patent
Estimating the term…
Abstract
According to one embodiment, an inspection system includes a first circuitry estimating whether an inspection target possesses a predetermined object, an antenna receiving a first electromagnetic wave, a second circuitry determining whether an electronic device is present in a predetermined range based on the first electromagnetic wave, and a third circuitry determining whether the inspection target possesses the predetermined object based on an estimation result of the first circuitry and a determination result of the second circuitry.
Claims16
An inspection system comprising:
- a first circuitry configured to estimate whether an inspection target possesses a predetermined object based on a received signal from a radar antenna;
- an antenna device configured to receive a first electromagnetic wave from an electronic device present in a predetermined range;
- a second circuitry configured to determine whether the electronic device is present in the predetermined range based on a received signal of the first electromagnetic wave received by the antenna device;
- and
- a third circuitry configured to determine whether the inspection target possesses the predetermined object based on an estimation result of the first circuitry and a determination result of the second circuitry,
- wherein:
- an electromagnetic wave receiving range of the antenna device includes the predetermined range,
- the radar antenna and the antenna device are provided on an antenna panel,
- an electromagnetic wave transmitting-and-receiving area of the antenna panel corresponds to the predetermined range, and
- the predetermined object is different from the electronic device.
7 more elements
Dependencies are inferred from the claim text.