Handler with cooling head and double-sided fin structure
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsTing-Yu Chiu, Yi-Neng Chang, Shin-Han You, Chien Fang Huang
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsTing-Yu Chiu, Yi-Neng Chang, Shin-Han You, Chien Fang Huang
Estimating the term…
A final test (FT) handler including a fin structure. The fin structure includes a first side and a second side opposite to the first side. A plurality of protrusions of the fin structure are at the first side and are defined or delimited by a plurality of recesses that extend into the first side of the fin structures. The plurality of protrusions are inserted into a TIM layer of the FT handler and the plurality of recesses are filled by the TIM layer. The plurality of protrusion and plurality of recesses increase a contact area between the TIM layer and the fin structure. The FT handler is configured to, in operation, pick up, hold onto, and transport one or more semiconductor devices to be tested, for example, with a high-performance computing (HPC) test for quality assurance and control purposes.
A device, comprising:
A system, comprising:
A fin structure configured to be utilized within a semiconductor package handler, comprising:
Dependencies are inferred from the claim text.