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US 12,693,310 B2Granted
Probe
AssigneeYokowo Co., Ltd.
InventorKenichi Sato
Life of this patent
Estimating the term…
Abstract
A probe includes greater than or equal to 15 mass % and less than or equal to 60 mass % of Pd, greater than or equal to 3 mass % and less than or equal to 79.9 mass % of Cu, and greater than or equal to 0.1 mass % and less than or equal to 75 mass % of at least one of Ni and Pt.
Claims15
A probe formed of an alloy, the alloy comprising:
- greater than or equal to 15 mass % and less than or equal to 60 mass % of Pd;
- greater than or equal to 3 mass % and less than or equal to 79.9 mass % of Cu;
- and
- greater than or equal to 0.1 mass % and less than or equal to 75 mass % of at least one of Ni and Pt, wherein when the alloy and a solder undergo heat treatment, the alloy has a solder resistance such that a diffusion layer in which both the solder and the Pd exist is less than or equal to 200 μm.
1 more element
Dependencies are inferred from the claim text.