Adaptation of illumination settings for optical measurement and inspection systems
AssigneeHexagon Innovation Hub GmbH
InventorsBernd Reimann, Fabian Braun, Alexandre Heili, Michael Zapp
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AssigneeHexagon Innovation Hub GmbH
InventorsBernd Reimann, Fabian Braun, Alexandre Heili, Michael Zapp
Estimating the term…
A method for optical inspection of a feature of interest on a workpiece using an optical measuring system comprising at least one camera and a plurality of light sources, the method comprising: simulating illumination of a workpiece model; training, based on synthetic images obtained from the simulated illumination, an AI agent or an ML model to automatically control the plurality of light sources; inferring, in at least one image captured by the at least one camera, properties of the feature of interest on the workpiece; the trained AI agent controlling the plurality of light sources to select a light setting for illuminating the feature of interest; and optically inspecting the illuminated feature of interest while it is illuminated with the selected light setting.
An optical measuring system for optical inspection of a feature of interest on a workpiece, the optical measuring system comprising a training unit and one or more optical measuring devices, each optical measuring device comprising a computing unit, at least one camera and a plurality of light sources, the light sources allowing selection of a plurality of different light settings, the computing unit being configured to at least partially control an optical inspection functionality of the optical measuring system for optical inspection of the feature of interest,
A method for optical inspection of a feature of interest on a workpiece using an optical inspection and/or measuring system comprising at least one camera and a plurality of light sources, the light sources allowing selection of a plurality of different light settings, the method comprising:
Dependencies are inferred from the claim text.