Method for localizing or tracking emitters in a sample
AssigneeAbberior Instruments GmbH
InventorRoman Schmidt
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AssigneeAbberior Instruments GmbH
InventorRoman Schmidt
Estimating the term…
The present specification relates to a method for localizing or tracking emitters in a sample, wherein the sample is illuminated with an intensity distribution of an illumination light comprising a local minimum, wherein light emissions of a measuring emitter induced or modulated by the illumination light are detected, and wherein a position of the measuring emitter is estimated based on the detected light emissions and assigned positions of the local minimum, wherein the estimated position of the measurement emitter is corrected based on calibration data dependent on a speed and/or an acceleration of a measurement scanning movement of a scanning device, or wherein an actuation signal of the scanning device is adapted based on calibration data, wherein the calibration data comprise localization data of a calibration emitter obtained by means of at least one calibration scanning movement of the scanning device.
A method for localizing or tracking emitters in a sample, wherein the sample is illuminated in a measuring step with an intensity distribution of illumination light, wherein the illumination light induces or modulates light emissions from emitters in the sample, wherein the intensity distribution comprises a local minimum, and wherein the intensity distribution and the sample are moved relative to one another by means of a scanning device in a measurement scanning movement, wherein light emissions of a measurement emitter in the sample induced or modulated by the illumination light are detected, and wherein a position of the measurement emitter is estimated based on the detected light emissions and the positions of the local minimum of the intensity distribution assigned to the light emissions,
A light microscope for localizing or tracking emitters in a sample, comprising
Dependencies are inferred from the claim text.