Particle measuring apparatus
AssigneeHitachi High-Tech Corporation
InventorsHiroyuki Minemura, Yumiko Anzai, Kentaro Osawa
Life of this patent
Estimating the term…
Loading patent…
AssigneeHitachi High-Tech Corporation
InventorsHiroyuki Minemura, Yumiko Anzai, Kentaro Osawa
Estimating the term…
An object of the invention is to provide a particle measuring device capable of determining a type of a particle. The particle measuring device according to the invention repeatedly scans a focal position of light along an optical axis direction in a three-dimensional region in a sample, calculates two or more of (a) one or more parameters that are obtained based on a maximum intensity of reflected light from particles, the maximum intensity being acquired from each focal position in a scanning process, and that indicate a type of the particles and (b) one or more parameters that are obtained based on positions of the particles acquired by continuously tracking the particles and that indicate a type of the particles, and outputs a calculation result.
A particle measuring device for measuring a particle contained in a sample containing a solvent and the particle, the particle measuring device comprising:
Dependencies are inferred from the claim text.