Wavelength measurement chip and wavelength measurement system

A wavelength measurement system, comprising:

• an optical chip comprising:
• an optical splitter configured to receive a first electromagnetic wave signal, and divide the first electromagnetic wave signal into two electromagnetic wave signals to be output;
• a first interferometer and a second interferometer, wherein the optical splitter, the first interferometer, and the second interferometer are disposed in sequential order, and the first interferometer and the second interferometer are configured to receive one of the two electromagnetic wave signals, so that the one electromagnetic wave signal is interfered by each of the first interferometer and the second interferometer to output a plurality of second electromagnetic wave signals, wherein another one of the two electromagnetic wave signals is output as a third electromagnetic wave signal, wherein the plurality of second electromagnetic wave signals include more than two second electromagnetic wave signals to achieve better accuracy, and a preset phase shift between every two adjacent second electromagnetic wave signals is the same;
• a photoelectric detector coupled to the wavelength measurement chip, and configured to receive a second electromagnetic wave signal and a third electromagnetic wave signal and convert the second electromagnetic wave signal and the third electromagnetic wave signal into electrical signals;
• and
• a processor electrically connected to the photoelectric detector, and configured to obtain wavelength information of the first electromagnetic wave signal based on the electrical signals;
• wherein the optical chip defines a first path and a second path, and the two electromagnetic wave signals are respectively transmitted along the first path and the second path;
• and
• wherein the optical splitter divides the first electromagnetic wave signal into the two electromagnetic wave signals according to a preset proportion to be output, wherein the preset proportion is determined based on optical losses of the first path and the second path.