Light-field imaging based on tilt-aberration
AssigneeDanmarks Tekniske Universitet
InventorsHugh Simons, Mario Alejandro Beltran
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AssigneeDanmarks Tekniske Universitet
InventorsHugh Simons, Mario Alejandro Beltran
Estimating the term…
A method, imaging system and computer program product for obtaining a transverse phase gradient of a wave field from at least a first and a second wavefield intensity map includes the steps of; capturing at a first incoherent tilt aberration the first wave field intensity map of a target at a first degree of incoherent tilt aberration, using a filter positioned between a source of electromagnetic radiation and an electromagnetic radiation detector capturing said first wave field intensity map; capturing at a second and different incoherent tilt aberration said second wave field intensity map of said target at a second degree of incoherent tilt aberration, using a filter positioned between a source of electromagnetic radiation and an electromagnetic radiation detector capturing the second wave field intensity map; determining the transverse phase gradient on the basis of at least a difference of logarithms of wavefield intensity maps divided by the magnitude of the difference between the first incoherent tilt aberration and the second incoherent tilt aberration.
A method for obtaining a transverse phase gradient of a wave field from at least a first wavefield intensity map and a second wave field intensity map, said method comprising the steps of:
An imaging system comprising:
Dependencies are inferred from the claim text.