Multispectral reflection imaging system
AssigneeCommissariat A L'energie Atomique Et Aux Energies Alternatives
InventorsJérôme Le Perchec, Mathieu Dupoy
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AssigneeCommissariat A L'energie Atomique Et Aux Energies Alternatives
InventorsJérôme Le Perchec, Mathieu Dupoy
Estimating the term…
An imaging device (100) configured to image a sample (102), comprising: a light source (104) emitting a light; a light deflection device configured to deflect the light emitted by the light source towards the sample, comprising a material portion (106) provided with a first main face (108) arranged opposite the sample (102), a second main face (110), and a first lateral face (112) towards which the light is emitted by the light source; an imager (118) having a detection face (122) arranged opposite the second main face and intended to receive the light backscattered by the sample; wherein one amongst the main faces is provided with oblique portions (114) each configured to deflect a portion of the received light towards the sample (102), and with planar portions (116) configured to let the light backscattered by the sample pass, and wherein each pixel (120) of the imager (118) is arranged opposite one of the planar portions (116) of said one amongst the first and second main faces (108, 110).
An imaging device configured to image a sample, comprising at least:
A method for making an imaging device configured to image a sample, comprising at least:
Dependencies are inferred from the claim text.