Method and system for characterizing an optical lens for correcting optical aberrations introduced by said optical lens in an image
AssigneeFogale Nanotech
InventorsEric Legros, Sylvain Petitgrand
Life of this patent
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AssigneeFogale Nanotech
InventorsEric Legros, Sylvain Petitgrand
Estimating the term…
A method for characterizing an optical lens that includes a stack of several optical elements and is intended to be associated with an image sensor for acquiring images, the method including determining, by optical measurement on the stack of optical elements, at least one data set (JG), referred to as geometric set, including data relating to at least one geometric parameter of at least one buried optical interface of the lens, digitally modeling the optical lens according to the geometric set, and determining, by an optical wave propagation digital simulator applied to the digital model, at least one matrix, referred to as aberration matrix, representative of optical aberrations introduced by the optical lens in an image. Also disclosed is a characterization device, an image acquisition method and device, and an imaging apparatus implementing such a method.
A method for characterizing an optical lens comprising a stack of a plurality of optical elements and intended to be associated with an image sensor for acquiring images, said method comprising the following steps:
A system for characterizing an optical lens including a stack of a plurality of optical elements and intended to be associated with an image sensor for acquiring images, said system comprising:
Dependencies are inferred from the claim text.