Test base cleaning line and method thereof
AssigneeSiliconware Precision Industries Co., Ltd.
InventorsHsiang-Yun Hung, Yi-Ren Chen, Chun-Yu Hsieh, Ping-Lin Chang
Life of this patent
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Abstract
A test base cleaning line and a method thereof are provided. The test base cleaning line includes a plurality of cleaning mechanisms, a scanning device, and a moving device. The scanning device is configured for scanning a barcode on a test base to identify a type of the test base, and the moving device is configured for moving the test base to any one of the plurality of cleaning mechanisms according to the type of the test base so that the cleaning mechanism can perform a cleaning operation to the test base.
Claims17
A test base cleaning line, comprising:
- a plurality of cleaning mechanisms;
- a scanning device configured for scanning a barcode on a test base to identify a type of the test base;
- and
- a moving device configured for moving the test base to any one of the plurality of cleaning mechanisms according to the type of the test base so that the cleaning mechanism performs a cleaning operation on the test base.
A method for cleaning a test base, comprising:
- scanning, by a scanning device, a barcode on the test base to identify a type of the test base;
- and
- moving, by a moving device, the test base to any one of a plurality of cleaning mechanisms according to the type of the test base so that the cleaning mechanism performs a cleaning operation on the test base.
Dependencies are inferred from the claim text.