Switching device electrically connected to a lead frame by a bonding material
AssigneeMitsubishi Electric Corporation
InventorsTatsuya Kawase, Naoki Yoshimatsu
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AssigneeMitsubishi Electric Corporation
InventorsTatsuya Kawase, Naoki Yoshimatsu
Estimating the term…
Provided is a semiconductor device reducing local increase in temperature caused by a void in a bonding material. A semiconductor device includes a conductive member, a semiconductor element, a bonding part, and a lead. The semiconductor element includes a switching element. The semiconductor element is held by the conductive member via a first bonding material. The bonding part is provided on an upper surface of the semiconductor element. The bonding part is electrically connected to an electrode of the switching element other than a gate electrode. The lead is bonded to the bonding part via a second bonding material. The bonding part and the second bonding material are provided in a region including a center part of the upper surface of the semiconductor element.
A semiconductor device, comprising:
A semiconductor device, comprising:
A semiconductor device, comprising:
A semiconductor device, comprising:
Dependencies are inferred from the claim text.