Computer, program, and charged particle beam processing system
AssigneeHitachi High-Tech Science Corporation
InventorsAyana Muraki, Tatsuya Asahata, Satoshi Tomimatsu, Makoto Sato
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AssigneeHitachi High-Tech Science Corporation
InventorsAyana Muraki, Tatsuya Asahata, Satoshi Tomimatsu, Makoto Sato
Estimating the term…
The present invention provides a computer, a program, and a charged particle beam processing system, with which it is possible to reduce adjustment and setting work of conditions for observation or machining by an operator in an FIB-SEM composite device. This computer comprises: an information acquisition unit that acquires information related to a recipe to be executed by a charged particle beam device provided with a charged particle irradiation optical system; and an information management unit that generates recipe management information based on the information acquired by the information acquisition unit and stores the recipe management information in a storage unit.
A charged particle beam processing system comprising
A charged particle beam processing system comprising a computer and a charged particle beam apparatus that comprises a charged particle irradiation optics,
Dependencies are inferred from the claim text.