Storage device for supporting dynamic allocation of memory and method of operating the same

A controller, comprising:

• a memory information storage configured to store defect information related to an address of a memory die in which a defect has occurred based on a result of a wafer test and a first memory condition in which the defect has occurred in the memory die;
• a state detector configured to detect a current memory condition including a temperature of a storage device and an operating voltage applied to the storage device;
• a memory controller configured to allocate, for an external operation request, memory dies in which no defects have occurred in the current memory condition and to exclude from allocation memory dies in which defects have occurred in the current memory condition;
• and
• an error detector configured to perform an error correction operation on an allocated memory die in which a defect has occurred in a second memory condition different from the first memory condition, from among memory dies in which no defects have occurred in the first memory condition.

A method of operating a controller, comprising:

• monitoring a current operating temperature of a storage device and a current operating voltage applied to the storage device;
• checking addresses of memory dies in which defects previously occurred at either the current temperature or the current voltage;
• allocating memory dies for an external operation request while excluding, from allocation, memory dies in which defects previously occurred at either the current temperature or the current voltage;
• and
• performing an error correction operation on a memory die, from among the allocated memory dies, in which a defect previously occurred at a temperature and a voltage different from the current temperature and voltage.