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US 12,682,870 B2Granted
Systems and methods for improving operating characteristics of displays
AssigneeSnap Inc.
InventorsStephen John Hart, Rock Edward Kent, Howard V. Goetz, James L. Sanford, Nicholas W. Melena
Life of this patent
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Abstract
Systems and methods for improving operating characteristics of displays such as liquid crystal on silicon displays.
Claims20
A display system, comprising:
- a display comprising a plurality of pixels;
- and
- a display driver to:
- store a plurality of bit-plane sequences, each bit-plane sequence comprising baseline voltage values for a plurality of bit-planes;
- measure a first phase ripple value of the display using the baseline voltage values;
- generate a modified bit-plane sequence by adding a voltage offset to at least one baseline voltage value of at least one bit-plane of the plurality of bit-planes of a first bit-plane sequence of the plurality of bit-plane sequences;
- measure a second phase ripple value of the display using the modified bit-plane sequence;
- and
- select between the first bit-plane sequence and the modified bit-plane sequence based on comparing the first and second phase ripple values.
6 more elements
A display driver, comprising:
- storage means to store a plurality of bit-plane sequences, each bit-plane sequence comprising baseline voltage values for a plurality of bit-planes;
- first measurement means to measure a first phase ripple value of a display using the baseline voltage values;
- bit-plane modification means to generate a modified bit-plane sequence by adding a voltage offset to at least one baseline voltage value of at least one bit-plane of the plurality of bit-planes of a first bit-plane sequence of the plurality of bit-plane sequences;
- second measurement means to measure a second phase ripple value of the display using the modified bit-plane sequence;
- and
- selection means to select between the first bit-plane sequence and the modified bit-plane sequence based on comparing the first and second phase ripple values.
3 more elements
A method, comprising:
- storing a plurality of bit-plane sequences, each bit-plane sequence comprising baseline voltage values for a plurality of bit-planes;
- measuring a first phase ripple value of a display using the baseline voltage values;
- generating a modified bit-plane sequence by adding a voltage offset to at least one baseline voltage value of at least one bit-plane of the plurality of bit-planes of a first bit-plane sequence of the plurality of bit-plane sequences;
- measuring a second phase ripple value of the display using the modified bit-plane sequence;
- and
- selecting between the first bit-plane sequence and the modified bit-plane sequence based on comparing the first and second phase ripple values.
3 more elements
Dependencies are inferred from the claim text.