Radar metrology system
AssigneeMitutoyo Corporation
InventorsNick Hartmann, Ted Staton Cook
Life of this patent
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AssigneeMitutoyo Corporation
InventorsNick Hartmann, Ted Staton Cook
Estimating the term…
A radar metrology system is provided for use with a movement system (e.g., a robot arm) that moves an end tool, and includes mobile and stationary radar configurations. The mobile radar configuration includes mobile radar components that are coupled to the end tool or an end tool mounting configuration. The stationary radar configuration includes stationary radar components (e.g., which define a metrology frame volume that surrounds a movement volume in which the end tool is moved). Distances are determined between stationary radar components and mobile radar components based at least in part on radar signals, wherein the distances indicate (e.g., and may be utilized to determine) a position and orientation (e.g., of the mobile radar configuration and/or end tool). The radar signals are either transmitted from stationary radar components and received by mobile radar components, or transmitted from mobile radar components and received by stationary radar components.
A radar metrology system for use with a movement system that moves an end tool,
A method for operating a radar metrology system for use with a movement system that moves an end tool,
A radar metrology system, comprising:
Dependencies are inferred from the claim text.